HELLO ,here I provide you information on indian instituation of technology Roorkee on scanning electron microscope (SEM)

About Scanning Electron Microscope (SEM)

When an electron beam strikes the sample which is at ground potential . the back scattered electrons, X-rays, secondary electrons etc. are radiated. Appropriate collection and processing of these radiations give lots of detail about the surface, atomic number of contents and composition.

detail :
1. Resolution : 4nm in HV and 6nm in VP
2. Accelerating Voltage : up to 30kV
3. Magnification : 10x to 300,000x
4. Stage : X, Y, Z, θ, φ, and eucentric goniometer
5. Detection Mode : Secondary electrons and Backscattered electron

Projects:

Following developmental and major/minor R&D projects have been taken by this section in collaboration with faculty of other departments.
Microprocessor based Reliability Analyzer.
Autoclave (1.5 Kbar).
8 line intercom. System with central microprocessor based exchange.
16 line microprocessor based electronic exchange.
C.R.T. Controller.
Microprocessor based data acquisition system and its PC interface for Mossbauer Spectroscopy.

Contact Person:

Mr. Jagdish Singh
Office Tel: 01332-285203
Email id: jsingmuc@iitr.ac.in