As you want to know about Scanning Electron Microscopy (SEM)

So here I am telling you About instrument

Scanning Electron Microscope Central Facility (SEMCF) is one such facility.

All students, researchers and faculty members from a range of science and
engineering departments of the institute are free to avail the services of
SEMCF as per the guidelines laid by the SEM user Committee of the institute.

These guidelines are regularly reviewed from every year .

Whenever it is possible, outside users from Industries, Research &
Development Organizations and other educational institutions are also
allowed to avail the facility against payment.

Zeiss EVO 50 & EVO 18 Special –

The SEM Central Facility at IIT Delhi has recently acquired a new ZEISS EVO
Series Scanning Electron Microscope EVO 50 and EVO 18.

The ZEISS EVO 50 is a versatile analytical microscope with a large specimen
chamber.

The EVO 50 series can hold large specimens at the analytical working
distance of 8.5mm owing to a combination of the inclined detectors and the
sharp conical objective lens.

The class leading X-ray geometry allows for the addition of an EDS detector.

Essential Specification: EVO 50:

Resolution-2.0nm@ 30kV (SE with LaB6 option )

Acceleration -Voltage 0.2 to 30 kV

Magnification -5x to 1,000,000x

Field of View -6 mm at the Analytical Working Distance (AWD)

X-ray Analysis-8.5 mm AWD and 35° take-off angle

Available Detectors

SE in HV - Everhart-Thornley

SE in VPSE

BSD in all modes - quadrant semiconductor diode

Some salient features of EDX analysis of known or unknown materials :

Qualitative and quantitative analysis for all elements from carbon upwards in
the periodic table

Quantitative analysis of homogenous bulk materials having features = 2 µm

Qualitative analysis of features = 0.2 µm

Detection limits typically 0.1 – 100 Wt% for most elements

Multi-element X-ray mapping and line scans Particle analysis – Detection,
analysis, morphology and size.