The IIT Bombay through its Sophisticated Analytical Instrument Facility is provides Field Emission Gun-Scanning Electron Microscopes.

Model detail of Field Emission Gun-Scanning Electron Microscopes:

Field Emission Gun-Scanning Electron Microscopes (FEG-SEM)

Instrument Details
Model : JSM-7600F

SEI Resolution : 1.0nm at 15 kv
1.5nm at 1 kv, in GB mode

Magnification : Low: 25X to 10,000X
High: 100X to 1,000,000X at 4x5 photo size

Accerating Voltage : 0.1 to 30 kv

Probe Current Range : 1 pA to ≥ 200 nA


The JEOL JSM-7600F FEG-SEM combines two proven technologies

Is an electron column with semi-in-lens detectors and an in the lens Schottky field emission gun

SEM is to deliver ultrahigh resolution combined with wide range of probe currents for all applications (1pA to more than 200 nA).

FEG-SEM Charges includes Service Tax:

Industry University National Lab/R&D's
Image Analysis 6900/- 1295/- 3106/- Per Sample
EDS 2300/- 432/- 1036/- For every EDS Analysis
WDS 4600/- 863/- 2070/- Per Spot

Contact to:

Sophisticated Analytical Instrument Facility,
IIT-Bombay, Powai, Mumbai-400 076
Tel : 022-25767691/2
Fax : 0091-22-25723314