I am providing following information related to Field Emission Gun-Scanning Electron Microscopes (FEG-SEM) Facility at IIT Bombay:

Instrument Details
Model : JSM-7600F
SEI Resolution: 1.0nm at 15 kv
1.5nm at 1 kv, in GB mode
Magnification : Low: 25X to 10,000X
High: 100X to 1,000,000X at 4x5 photo size
Accerating Voltage : 0.1 to 30 kv
Probe Current Range : 1 pA to ≥ 200 nA

The JSM-7600F successfully integrates a full set of detectors that make it ideal for: anotechnology, material science, biology, compositional and micro-structural analysis.

FEG-SEM Charges includes GST:
Industry University National Lab/R&D's
Image Analysis 7080/- 1328/- 3186/- Per Sample
EDS 2360/- 443/- 1062/- For every EDS Analysis
WDS 4720/- 885/- 2124/- Per Spot

Additional Rs 100/- towards postal charge if results are to be posted.
The Demand Draft should be in favour of "The Registrar, IIT Bombay" Letter, DD & Samples send to "Head SAIF, IIT Bombay, Powai, Mumbai-400076"

Helpline
Contact : 022-25764390
Email Id :fegsemlab@iitb.ac.in