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Sophisticated Analytical Instrument Facility (SAIF) was established in the year 1976 at IIT Bombay

The main objectives of SAIF facilities are:

To provide for guidance acquisition of data using Sophisticated Instruments
To organize workshops on the use and application of various spectroscopic and analytical technique

Facilities

CHNSO Elemental Analyzer(CHNS)
Electron Spin Resonance Spectrometer(ESR)
Field Emission Gun-Scanning Electron Microscopes(FEG-SEM)
FTIR-Imaging Systeml(FTIR-IMG)
Gas Chromatograph With High Resolution Mass Spectrometer(GC-HRMS)
ICP-Atomic Emission Spectrometer(ICP-AES)
ICP-Mass Spectrometry(ICP-MS)
High Resolution Liquid Chromatograph Mass Spectrometer (HR-LCMS)
Liquid Chromatograph Mass Spectrometer (LC-MS)
Nuclear Magnetic Resonance Spectrometer(NMR)
Thermal Analysis System(TAS)
High Resolution-Transmission Electron Microscope 300 kV (HR-TEM)
Transmission Electron Microscope(TEM)
Time-of-Flight Secondary Ion Mass Spectrometer (ToF SIMS)
X-Ray Fluorescence Spectrometer(XRF)
CRYO FEG SEM (Chemical Engineering Department)
Four Dimensional X-ray Microscopy (Central facility)

Contact:
Sophisticated Analytical Instrument Facility,
IIT-Bombay,
Powai, Mumbai-400 076
Tel : 022-25767691/2
Fax : 0091-22-25723314