Advanced Facility for Microscopy and Microanalysisis (AFMM) centre for electron microscopy emerged out of a growing need at Indian Institute of Science IISc for centralized state-of-the-art facilities for microstructural characterization.

Charges-

Private Industry Government R&D Other Academic IISc
Laboratories Organisations

TEM UT20 5000 2500 1000 500

TEM ST20 5000 2500 1000 500

TEM F30 5000 2500 1000 500


ESEM Quanta 5000 2500 1000 500

Sem Sirion 5000 2500 1000 500

EPMA 5000 2500 1000 500

FIB 5000 2500 1000 500

Xray Tomography Xradia 5000 2500 1000 500

AFM/Nanoindenters 2000 1000 400 200

Specimen Preparation 400 200 100 50

AFMM User Rates IN RS/Hour ADD 14.5% TAX

Facilities

FEI Sirion XL30 FEG SEM
FEI ESEM Quanta 200
FEI Tecnai F30 S-TWIN TEM
FEI Tecnai T20 S-TWIN TEM
FEI Tecnai T20 U-TWIN TEM
FEI Strata 200xp Focused Ion Beam
Nano Indenter
AFM-Atomic Force Microscope
EPMA: JEOL JXA8230
Xradia versa XRM500

Faculty-

K. Chattopadhyay, Ph.D. (1978), Banaras Hindu Univ.
Professor

Dipankar Banerjee, Ph.D. (1979), IISc Bangalore
Professor

V.Jayaram, Ph.D. (1984), Stanford
Professor

N.Ravishankar, Ph.D. (1998), IISc
Associate Professor

Satyam Suwas, Ph.D. (1999), IIT Kanpur
Associate Professor

Chandan Srivastava , Ph.D.(2009),Univ.of Alabama,USA
Assistant Professor

Bikramjit Basu , Ph.D.(2001), Univ.of Leuven, Belgium
Associate Professor

Kaushik Chatterjee , Ph.D.(2007), Penn.StateUniv, USA
Assistant Professor

Sajeev Kirshnan , Ph.D.(1999), Okayama University, Japan
Assistant Professor

Contact-

Advanced Facility for Microscopy and Microanalysis
Indian Institute of Science
Bangalore - 560 012, India
Telephone : +91-080-2293 2034/35 +91-080-2293 2729
Fax : +91-080-2293 2035